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PRODUCTS
Solutions for Spectroscopy, TCSPC & Imaging
hardLIGHT
HP Spectroscopy hardLIGHT Hard X-ray spectrograph
- von Hamos, Johann, or Johansson geometry
- single-shot diagnostics at 2 to 4 keV
- backscattering mode for online beam characterization
- XES mode for investigating material samples
- energy resolution of 0.3eV
Catalog
Application
photon diagnostics at HHG beamlines, X-ray free-electron lasers, table-top X-ray lasers, in-situ XES measurements
