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Solutions for Spectroscopy, TCSPC & Imaging

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PRODUCTS
Spectrometer
Raman, PL, Fluorescence System
Film Thickness Analysis system
Thin Film Measurement Systems for Single and Multilayer Film Structures


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Real-time Spectral capture for Reflectancer(Transmittance)

- Supports multilayer, freestanding, rough, & both thick & thin layers

- Supports Parameterized materials: Cauchy, Sellmeir, EMA, Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz

경기도 하남시 조정대로 150 하남지식산업센터(ITECO) 그린존 O213호
Tel : 02.486.7930 / Fax : 02.486.7931 / E-mail : kos@kosinc.co.kr
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