SPC-180N Series
TCSPC/FLIM Modules
  • SPC-180N, SPC-180NX, SPC-180NXX
  • PCIe
  • FLIM, PLIM
  • Timing Precision (jitter, RMS) 2.5 ps/1.6 ps/1.1 ps


Specification

SPC-180N

SPC-180NX

SPC-180NXX

Photon Channel

 

Principle

Constant Fraction Discriminator (CFD)

Discriminator Input Bandwidth

4 GHz

Time Resolution (FWHM/RMS, electr.)

6.6 ps / 2.5 ps

< 3.5 ps / 1.6 ps

< 3 ps / 1.1 ps

Variance in Time of IRF max. (RMS)

< 0.4 ps over 100 s

Optimum Input Voltage Range

-30 mV to -500 mV

Min. Input Pulse Width

200 ps

Threshold

0 to -250 mV

Zero Cross Adjust

-100 mV to 100 mV

Syncronisation Channel

 

Principle

Constant Fraction Discriminator (CFD)

Discriminator Input Bandwidth

4 GHz

Optimum Input Voltage Range

-30 mV to -500 mV

Min. Input Pulse Width

200 ps

Threshold

0 to -250 mV

Frequency Range

0 to 150 MHz

Frequency Divider

1, 2, 4

Zero Cross Adjust

-100 mV to 100 mV

Time-to-Amplitude Converters / ADCs

 

Principle

Ramp Generator / Biased Amplifier

TAC Range

50 ns to 5 µs

25 ns to 2.5 µs

12.5 ns to 50 ns

Biased Amplifier Gain

1 to 15

Biased Amplifier Offset (of TAC Range)

0 % to 50 %

Time Range incl. Biased Amplifier

3.3 ns to 5 µs

1.67 ns to 2.5 µs

0.834 ns to 50 ns

Min. Time Channel Width

813 fs

407 fs

203 fs

ADC Principle

50 ns Flash ADC with Error Correction

Diff. Nonlinerarity

< 0.5 % RMS, typ. < 1 % peak-peak

Data Acquisition

Histogram Mode

Method

on-board multi-dim. histogramming process

Dead Time

80 ns, independent of computer speed

Saturated Count Rate

12 MHz

Max. Counts / Time Channel

16 bits

Overflow Control

none, stop, repeat and correct

Collection Time

0.1 µs to 100,000 s

Diplay Interval Time

10 ms to 100,000 s

Repeat Time

0.1 µs to 100,000 s

Sequencing Recording

Programmable Hardware Sequencer, unlimited recording by Memory swapping, in curve mode and scan mode

Syncronisation with Scanning

Pixel, Line and Frame from Scanning Device

Routing

7 bit, TTL

Experiment Trigger

TTL

Data Acquisition

FIFO / Parameter-Tag Mode

Method

Time and wavelength tagging of individual photons and continuous writing to disk

Online Display

Decay functions, FCS, Cross-FCS, PCH MCS Traces

FCS Calculation

Multi-tau algorithm, online calculation and online fit

Number of Counts of Decay/ Waveform Recording

unlimited

Dead Time

80 ns

Saturated Count Rate, Peak

12 MHz

Sustained Count Rate (Bus Transfer Limit)

typ. 5 MHz

Max. Counts / Time Channel (Counting Depth)

unlimited

Output Data Format (ADC / Macrotime / Routing)

12 / 12 / 4

FIFO Buffer Capacity (Photons)

2 * 106

Macro Timer Resolution, Internal Clock

25 ns, 12 bit, overflows marked by MOTF entry in data stream

Input Macro Timer Resolution, Clock from Sync

10 ns to 100 ns, 12 bit, overflow marked by MOTF entry in data stream

Input Curve Control (external Routing)

4 bit, TTL

External Event Markers

4 bit, TTL

Input Count Enable Control

1 bit, TTL

Input Experiment Trigger

TTL

Data Acquisition

FIFO / Parameter-Tag Imaging Mode

Method

Buildingup images from time- and wavelength tagged data

Online Display

up to 8 Images in different time and wavelength windows

Synchronisation with Scanner

via Frame Clock, Line Clock and Pixel Clock Pulses

Detector / Wavelength Channels

1 to 16

Image resolution (64-bit SPCM Software)

 

No. of Time Channels

64

256

1024

4096

No. of Pixels, 1 Detector Channel

4096 x 4096

2048 x 2048

1024 x 1024

512 x 512

No. of Pixels, 16 Detector Channels

1024 x 1024

512 x 512

256 x 256

128 x 128

Operation Environment

 

PC System

Windows 8 / 10, > 8 GB RAM, 64 bit operating system recommended

PC Interface

PCIe

Power Consumption

approx. 12 W from +12 V

Dimensions

230 mm x 130 mm x 18 mm


경기도 하남시 조정대로 150 하남지식산업센터(ITECO) 그린존 O213호
Tel : 02.486.7930 / Fax : 02.486.7931 / E-mail : kos@kosinc.co.kr
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