Solutions for Spectroscopy, TCSPC & Imaging

New Product

X-ray Absorption Spectroscopy system
integrated XAFS solution

table-top NEXAFS system

X-ray Absorption Spectroscopy system



hiXAS integrated XAS solution


- lab-based turn-key EXAFS and XANES system
- synchrotron-quality spectra 

- very high signal to noise ratio 
- wide bandpass of up to 1keV

hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.

Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary.

The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges.​

Customized versions of hiXAS are available. For applications at lower energies, see proXAS.

Elemental range


Range of elements accessible to hiXAS for EXAFS and XANES measurements. Even diluted samples with analyte concentrations of only a few weight percent can be measured in a time frame of several minutes.







X-ray absorption measurement of a Cu foil Acquisition time: 3 min with sample 1.5 min without sample

C. Schlesiger et al, Recent progress in the performance of HAPG based laboratory EXAFS and XANES spectrometers 
J. Anal. At. Spectrom. 35, 2298 (2020)






X-ray absorption spectrum of a 6um-thick Ni foil. Comparison to the spectrum obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000) shows the high quality results of the table-top instrument. All relevant spectral features are present, allowing for the determination of chemical compounds.


- Chemical speciation and concentration ratios

- Compound research

- Short range order and bond length determination

- Catalyst analysis


table-top NEXAFS system

- first integrated NEXAFS spectroscopy solution
- no need to apply for beamtime
- chemical state analysis for geology, biology, materials research
- synchrotron-quality spectra 

proXAS is the first system on the market to offer NEXAFS measurements in a laboratory. Fingerprinting for element analysis is now possible in-house with fast and accurate results.

It combines a highly-reliable laser-based XUV source and a customized spectrometer with an extremely high resoling power of 1900. The energy range200-1200eV allows for measurements at the K-edge of elements such as C, N. O, Ca, K, Ti.

Customized versions of proXAS are available. For applications at higher energies, see hiXAS.






NEXAFS spectrum at the carbon K-edge of a polyimide film (t=200nm).
(1) measured with the table-top system, averaging over 60 pulses.
(2) NEXAFS spectrum recorded at a synchrotron for comparison


- Surface science

- Chemical state analysis in geochemistry

- Electronic structure and oxidation state analysis

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