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Solutions for Spectroscopy, TCSPC & Imaging
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integrated XAFS solution
proXAS
table-top NEXAFS system
X-ray Absorption Spectroscopy system
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hiXAS integrated XAS solution |
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- lab-based turn-key EXAFS and XANES system - very high signal to noise ratio |
hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.
Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary.
The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges.
Customized versions of hiXAS are available. For applications at lower energies, see proXAS.
Elemental range |
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Range of elements accessible to hiXAS for EXAFS and XANES measurements. Even diluted samples with analyte concentrations of only a few weight percent can be measured in a time frame of several minutes. |
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Results |
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X-ray absorption measurement of a Cu foil Acquisition time: 3 min with sample 1.5 min without sample C. Schlesiger et al, Recent progress in the performance of HAPG based laboratory EXAFS and XANES spectrometers |
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X-ray absorption spectrum of a 6um-thick Ni foil. Comparison to the spectrum obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000) shows the high quality results of the table-top instrument. All relevant spectral features are present, allowing for the determination of chemical compounds. |
Applications
- Chemical speciation and concentration ratios
- Compound research
- Short range order and bond length determination
- Catalyst analysis
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proXAS |
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proXAS is the first system on the market to offer NEXAFS measurements in a laboratory. Fingerprinting for element analysis is now possible in-house with fast and accurate results.
It combines a highly-reliable laser-based XUV source and a customized spectrometer with an extremely high resoling power of 1900. The energy range200-1200eV allows for measurements at the K-edge of elements such as C, N. O, Ca, K, Ti.
Customized versions of proXAS are available. For applications at higher energies, see hiXAS.
Results |
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NEXAFS spectrum at the carbon K-edge of a polyimide film (t=200nm). |
Applications
- Surface science
- Chemical state analysis in geochemistry
- Electronic structure and oxidation state analysis
