PRODUCTS
Solutions for Spectroscopy, TCSPC & Imaging
HP Spectroscopy hardLIGHT Hard X-ray spectrograph von Hamos, Johann, or Johansson geometry - single-shot diagnostics at 2 to 4 keV - backscattering mode for online beam characterization - XES mode for investigating material samples - energy resolution of 0.3eV
Catalog
Application
photon diagnostics at HHG beamlines, X-ray free-electron lasers, table-top X-ray lasers
in-situ XES measurements